Zhengzhou Wang, Yaxuan Duan, Li Wang, Gang Li, Jiafu Guo. Detection method of sidelobe peaks parameter for far-field measurement based on the diffraction inversion of sidelobe beam[J]. Infrared and Laser Engineering, 2023, 52(1): 20220281
- Infrared and Laser Engineering
- Vol. 52, Issue 1, 20220281 (2023)
Fig. 1. Optical design for far field measurement of focus spot using schlieren method based on diffraction inversion of sidelobe beam
Fig. 2. Flow chart of data processing
Fig. 3. Image of sidelobe beam diffraction inversion
Fig. 3. [in Chinese]
Fig. 4. Angle transformation image
Fig. 5. Parameter detection of sidelobe peak of one-dimensional beam curve in any direction
Fig. 6. Maximum curve rings of each sidelobe peak
Fig. 7. Theoretical one-dimensional curve to detect the parameters of sidelobe peak (Y = 256)
Fig. 8. Detected peak and trough position of one-dimensional sidelobe noise curve (Y = 256)
Fig. 9. All maximum curve rings of each sidelobe peak
Fig. 10. Detected parameters of each sidelobe peak of sidelobe beam in any directions
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Table 1. Detected parameters of sidelobe peak of theoretical one-dimensional curve (Y =256)
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Table 2. Detected parameters of each sidelobe peak of one-dimensional noise curve (Y =256)
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Table 3. Statistics of distribution characteristics of 5 maximum curve rings
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