Infrared Defect Emission and Thermal Effect in High Power Diode Lasers

Fangyu Yue; Feng Mao; Han Wang; Xiaoling Zhang; Ye Chen; Chengbin Jing; Junhao Chu

doi:10.3788/LOP56.110001

Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 11 >Page 110001 > Article

Laser & Optoelectronics Progress
Vol. 56, Issue 11, 110001 (2019)

Infrared Defect Emission and Thermal Effect in High Power Diode Lasers

Fangyu Yue^1,*, Feng Mao¹, Han Wang¹, Xiaoling Zhang¹..., Ye Chen¹, Chengbin Jing¹ and Junhao Chu^1,2|Show fewer author(s)

Author Affiliations

¹ Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Optoelectronics, School of Information Science Technology, East China Normal University, Shanghai 200241, China

² National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

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DOI: 10.3788/LOP56.110001 Cite this Article Set citation alerts

Fangyu Yue, Feng Mao, Han Wang, Xiaoling Zhang, Ye Chen, Chengbin Jing, Junhao Chu. Infrared Defect Emission and Thermal Effect in High Power Diode Lasers[J]. Laser & Optoelectronics Progress, 2019, 56(11): 110001 Copy Citation Text

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