Fangyu Yue, Feng Mao, Han Wang, Xiaoling Zhang, Ye Chen, Chengbin Jing, Junhao Chu. Infrared Defect Emission and Thermal Effect in High Power Diode Lasers[J]. Laser & Optoelectronics Progress, 2019, 56(11): 110001
- Laser & Optoelectronics Progress
- Vol. 56, Issue 11, 110001 (2019)
Fig. 1. EL spectra from front facet of HPLD based on asymmetric InGaAs/AlGaAs single quantum well structure at different steady-state injection currents
Fig. 2. EL signal from front facet at injection current of 600 mA
Fig. 3. EL spectra from front and sidefacets of device at injection direct current of 600 mA
Fig. 4. EL II of device at steady-state injection current. (a) EL II from cavity front and side facets at 980 nm; (b) defect-related EL II at 1.3 μm
Fig. 5. Thermal image dynamics corresponding to SWIR and MWIR signals of device before and after COD under pulsed injection current
Fig. 6. EL spectra from front facet of 440 nm laser based on InGaN/GaN multiple quantum well structure under steady-state injection direct current
Fig. 7. EL spectra and analysis results of 440 nm laser under different injection current intensities. (a) EL spectra from front facet; (b) EL II versus injection current intensity
Fig. 8. EL spectra fromfront facet of 440 nm laser at different injection currents
Fig. 9. EL spectra from front facet of 440 nm laser under different injection currents
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