• Laser & Optoelectronics Progress
  • Vol. 60, Issue 16, 1609001 (2023)
Huabin Wang1,2, Yu He1,2, and Lixin Zhao1,2,*
Author Affiliations
  • 1State Key Laboratory of Optical Technologies on Nano-Fabrication and Micro-Engineering, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, Sichuan, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China
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    DOI: 10.3788/LOP222978 Cite this Article Set citation alerts
    Huabin Wang, Yu He, Lixin Zhao. Holographic Double-Sided Photolithography Based on Improved Gerchberg-Saxton Algorithm[J]. Laser & Optoelectronics Progress, 2023, 60(16): 1609001 Copy Citation Text show less
    Schematic of the double-sided photolithography based on computer-generated holography algorithm
    Fig. 1. Schematic of the double-sided photolithography based on computer-generated holography algorithm
    Schematic of the optical path of the improved GS algorithm
    Fig. 2. Schematic of the optical path of the improved GS algorithm
    Flow chart of iterative optimization of improved GS algorithm
    Fig. 3. Flow chart of iterative optimization of improved GS algorithm
    Reconstructed images of light field at different depths in the target volume calculated by simulation. (a) Letter B; (b) letter A
    Fig. 4. Reconstructed images of light field at different depths in the target volume calculated by simulation. (a) Letter B; (b) letter A
    Simulated images of two-layer image plane in the presence of crosstalk. (a) Letter B; (b) letter A
    Fig. 5. Simulated images of two-layer image plane in the presence of crosstalk. (a) Letter B; (b) letter A
    Diagram of experimental system of double-sided photolithography based on computer-generated holography algorithm
    Fig. 6. Diagram of experimental system of double-sided photolithography based on computer-generated holography algorithm
    Image plane without eliminating speckle and stray light. (a) Image plane in the presence of speckle; (b) image plane in the presence of stray light
    Fig. 7. Image plane without eliminating speckle and stray light. (a) Image plane in the presence of speckle; (b) image plane in the presence of stray light
    Image planes observed by the camera at different positions. (a) Image plane B; (b) image plane A
    Fig. 8. Image planes observed by the camera at different positions. (a) Image plane B; (b) image plane A
    Exposure results of photosensitive resin. (a) Exposure result of the front surface of the substrate; (b) exposure result of the posterior surface of the substrate
    Fig. 9. Exposure results of photosensitive resin. (a) Exposure result of the front surface of the substrate; (b) exposure result of the posterior surface of the substrate
    Results after exposure and development of photoresist. (a) High diffraction order exposure on the front surface of the substrate;(b) zero order exposure on the posterior surface of the substrate
    Fig. 10. Results after exposure and development of photoresist. (a) High diffraction order exposure on the front surface of the substrate;(b) zero order exposure on the posterior surface of the substrate