In the field of microscopy, achieving a wider field of view and higher resolution are two critical goals pursued by researchers. Structured illumination microscopy (SIM) has effectively addressed the demand for higher resolution by surpassing the optical diffraction limit. However, limitations in beam range within structured illumination systems often cause pixel aliasing image artifacts when increasing the field of view. To eliminate these artifacts, we combine the coded aperture imaging technique, commonly used in computational imaging, with structured illumination microscopy, thereby proposing a super-resolution microscopy method that utilizes a square aperture to enhance the field of view. The square aperture is used to recover mixed frequency domain information in images captured with a 60× objective lens, ultimately reconstructing images that achieve the same resolving power as a 100× objective lens while attaining a fourfold increase in the field of view. The effectiveness of this method is demonstrated through both simulated and actual imaging data. This study provides a novel approach for enhancing the field of view in super-resolution structured illumination microscopy systems.