Zhuorui TANG, Chaobin MAO, Yinghuai ZHANG, Chang FENG, Minyan QIU, Cheng HU, Xin ZHANG. CGH compensation surface testing technology for high-order SiC aspherical secondary mirror[J]. Infrared and Laser Engineering, 2025, 54(2): 20240519
- Infrared and Laser Engineering
- Vol. 54, Issue 2, 20240519 (2025)
Fig. 1. The optical path diagram of CGH compensation testing of the secondary mirror
Fig. 2. The optical path design diagram of CGH null compensation high-order aspheric secondary mirror
Fig. 3. Design residual of the main area
Fig. 4. Fringe diagram of the main area of CGH designed for high-order aspherical secondary mirror
Fig. 5. Fringe diagram of CGH alignment area of high-order aspherical secondary mirror
Fig. 6. Optical path diagram of the diffraction order separation of the high-order aspherical secondary mirror
Fig. 7. Schematic diagram of the diffraction order separation of high-order aspherical secondary mirror
Fig. 8. Surface map of the high-order aspherical secondary mirror interference detection results
Fig. 9. Surface map of transmission wave aberration detection results of CGH
Fig. 10. CGH substrate error Zernike fitting result
Fig. 11. Surface map of the high-order aspherical secondary mirror interference detection results after calibration
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Table 1. The basic parameters of the optical path
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