Yiqun Cen, Junling Zhang, Honglei Chen, Ruijun Ding. Research on testing technology of column-level ADC in IRFPA digital readout circuits[J]. Infrared and Laser Engineering, 2020, 49(4): 0404004
- Infrared and Laser Engineering
- Vol. 49, Issue 4, 0404004 (2020)
Fig. 1. Architecture of digital readout circuits with column-level ADC
Fig. 2. ADC static performance DNL, INL and missing code
Fig. 3. Distribution of output codes at V in=1.039 V
Fig. 4. Schematic block diagram of the testing system
Fig. 5. Front panel of Labview( parameter setting module)
Fig. 6. Front panel of Labview (data acquisition module and display module)
Fig. 7. DNL and INL curves
Fig. 8. Time domain diagram of digital outputs
Fig. 9. Frequency domain diagram of digital outputs
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