Brief analysis of research trends of high power microwave effect in the United States

Shuai Zhang; Yibo Zhang; Min Tu

doi:10.11884/HPLPB202436.230304

Journals >High Power Laser and Particle Beams >Volume 36 >Issue 1 >Page 013001 > Article

High Power Laser and Particle Beams
Vol. 36, Issue 1, 013001 (2024)

Brief analysis of research trends of high power microwave effect in the United States

Shuai Zhang^1,2, Yibo Zhang², and Min Tu²

Author Affiliations

¹School of Microelectronics, Xi’an Jiaotong University, Xi’an 710049, China

²Key Laboratory of Advanced Science and Technology on High Power Microwave, Northwest Institute of Nuclear Technology, Xi’an 710024 China

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DOI: 10.11884/HPLPB202436.230304 Cite this Article

Shuai Zhang, Yibo Zhang, Min Tu. Brief analysis of research trends of high power microwave effect in the United States[J]. High Power Laser and Particle Beams, 2024, 36(1): 013001 Copy Citation Text

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HPM radiation incident upon a target can couple into the target via front door and back door pathways and cause effects on internal electronics within the target structure [6]

Fig. 1. HPM radiation incident upon a target can couple into the target via front door and back door pathways and cause effects on internal electronics within the target structure^[6]

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Fig. 2. Introduction of US Air Force Research Laboratory high power microwave effect research^[7]

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front door coupling paths	back door coupling paths
➢ HPM field couples to antennas ➢ in-band HPM energy at receiver➢ vulnerable components: low noise amplifiers (LNAs), limiters➢ effect is generally damage➢ can achieve EW-like effects with upset	➢ control/guidance systems involve digital electronics➢ HPM field couples to control wires (e.g. UAS), internal cables (e.g. missile)➢ effect typically disruption of digital electronics

Table 1. Expanded effects understanding in counter-UAS and counter-missile

Shuai Zhang, Yibo Zhang, Min Tu. Brief analysis of research trends of high power microwave effect in the United States[J]. High Power Laser and Particle Beams, 2024, 36(1): 013001

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