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    Journals >Opto-Electronic Engineering >Volume 31 >Issue 10 >Page 32 > Article
    • Opto-Electronic Engineering
    • Vol. 31, Issue 10, 32 (2004)
    A fast defect-detecting method for smooth hemispherical shell surface
    1, 2, 1, 1, and 1
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A fast defect-detecting method for smooth hemispherical shell surface[J]. Opto-Electronic Engineering, 2004, 31(10): 32 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A fast defect-detecting method for smooth hemispherical shell surface[J]. Opto-Electronic Engineering, 2004, 31(10): 32
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