• Opto-Electronic Engineering
  • Vol. 33, Issue 9, 71 (2006)
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New method for measuring dynamic position of optical target using high-precision total station[J]. Opto-Electronic Engineering, 2006, 33(9): 71 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. New method for measuring dynamic position of optical target using high-precision total station[J]. Opto-Electronic Engineering, 2006, 33(9): 71
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