• Opto-Electronic Advances
  • Vol. 6, Issue 2, 220049 (2023)
Yangyundou Wang1,2,*, Hao Wang3, and Min Gu1,2,**
Author Affiliations
  • 1Institute of Photonic Chips, University of Shanghai for Science and Technology, Shanghai 200093, China
  • 2Centre for Artificial-Intelligence Nanophotonics, School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
  • 3School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    DOI: 10.29026/oea.2023.220049 Cite this Article
    Yangyundou Wang, Hao Wang, Min Gu. High performance “non-local” generic face reconstruction model using the lightweight Speckle-Transformer (SpT) UNet[J]. Opto-Electronic Advances, 2023, 6(2): 220049 Copy Citation Text show less
    SpT UNet architecture for spatially dense feature reconstruction (a) with the multi-head attention (or cross attention) module (b) included transformer encoder block (c) and decoder block (d).
    Fig. 1. SpT UNet architecture for spatially dense feature reconstruction (a) with the multi-head attention (or cross attention) module (b) included transformer encoder block (c) and decoder block (d).
    The puffed downsampling - module architecture.
    Fig. 2. The puffed downsampling - module architecture.
    The leaky upsampling - module architecture.
    Fig. 3. The leaky upsampling - module architecture.
    Experiment set-up.
    Fig. 4. Experiment set-up.
    Overview of the data acquisition under various conditions and the training/testing/validation of the SpT UNet. (a) The training/testing data set is captured at T1 (0 mm), and T2 (20 mm). And the validation data set is captured at T3 (40 mm). The training/testing stage (b) and the validation stage (c) of the SpT UNet for the speckle reconstruction of the generic face images.
    Fig. 5. Overview of the data acquisition under various conditions and the training/testing/validation of the SpT UNet. (a) The training/testing data set is captured at T1 (0 mm), and T2 (20 mm). And the validation data set is captured at T3 (40 mm). The training/testing stage (b) and the validation stage (c) of the SpT UNet for the speckle reconstruction of the generic face images.
    The ground truth (left column) and prediction (right column) of the trained SpT UNet with the camera placed at 40 mm away from the focal plane.The prediction results are overlaid with the true positive (white), false positive (green), and false negative (red).
    Fig. 6. The ground truth (left column) and prediction (right column) of the trained SpT UNet with the camera placed at 40 mm away from the focal plane.The prediction results are overlaid with the true positive (white), false positive (green), and false negative (red).
    Quantitative analysis of the trained SpT UNet using NPCC as the loss function (a) and SSIM as the indicator for accuracy (b).
    Fig. 7. Quantitative analysis of the trained SpT UNet using NPCC as the loss function (a) and SSIM as the indicator for accuracy (b).
    MethodImage sizeFLOPs/109ParametersThroughput (image/s)Inference time(batch/ms)
    SpT UNet256×25631.76.6 M62.531.34
    SpT UNet224×22424.36.6 M83.324.02
    SpT UNet200×20019.46.6 M86.923.02
    SpT UNet-B256×25619.64.0 M78.525.46
    SpT UNet-B224×22415.04.0 M90.822.02
    SpT UNet-B200×20012.04.0 M95.121.02
    Table 0. Performance of the SpT UNet.
    IndicatorDiffuser/grit
    1202206001500
    PCC0.989860.989880.989900.98994
    JI0.976550.976580.976610.97666
    SSIM0.950010.950090.950240.95035
    PSNR/dB19.382619.388719.395419.4052
    Table 0. The validation performance of the trained SpT UNet.
    MethodParameters
    SpT UNet6.6 M
    SpT UNet-B4.0 M
    SWIN transformer197 M
    SWIN transformer-B88 M
    ViT303 M
    ViT-B86 M
    Table 0. The comparison of the SpT UNet, ViT, and SWIN transformer on parameter numbers.
    Yangyundou Wang, Hao Wang, Min Gu. High performance “non-local” generic face reconstruction model using the lightweight Speckle-Transformer (SpT) UNet[J]. Opto-Electronic Advances, 2023, 6(2): 220049
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