• Optoelectronic Technology
  • Vol. 41, Issue 3, 218 (2021)
Guozhi WANG, Yong LIU, Jian WANG, Wei ZHU, and Zhoushuo CHU
Author Affiliations
  • CCPD Display Technology Co. LTD.,Chengdu 610200, CHN
  • show less
    DOI: 10.19453/j.cnki.1005-488x.2021.03.011 Cite this Article
    Guozhi WANG, Yong LIU, Jian WANG, Wei ZHU, Zhoushuo CHU. Drawing Design Optimization of IGZO TFT[J]. Optoelectronic Technology, 2021, 41(3): 218 Copy Citation Text show less
    Bottom gate of anti-overlapping TFT structure
    Fig. 1. Bottom gate of anti-overlapping TFT structure
    The design drawings of HT
    Fig. 2. The design drawings of HT
    The design of channel drawing 5 mask and 4 mask
    Fig. 3. The design of channel drawing 5 mask and 4 mask
    The critical value of HT zone
    Fig. 4. The critical value of HT zone
    The influence trend of L and a on the value of b
    Fig. 5. The influence trend of L and a on the value of b
    Film thickness trend
    Fig. 6. Film thickness trend
    The SEM picture of channel area after photoetching
    Fig. 7. The SEM picture of channel area after photoetching
    The SEM picture of channel area after ashing
    Fig. 8. The SEM picture of channel area after ashing
    The influence trend of L on the value of c
    Fig. 9. The influence trend of L on the value of c
    The picture of channel area after photoetching
    Fig. 10. The picture of channel area after photoetching
    The SEM picture of channel area after etching
    Fig. 11. The SEM picture of channel area after etching
    The picture of channel area after etching and stripping
    Fig. 12. The picture of channel area after etching and stripping
    NO.W/μmL/μma/μm
    12030
    22040
    32050
    42060
    520100
    620200
    720300
    820400
    920100.5
    1020101.0
    1120101.5
    1220102.0
    Table 1. The channel length and compensation values for TFT
    NO.W/μmL/μma/μmb/μm
    12030-1.340
    22040-1.538
    32050-1.734
    42060-1.885
    520100-2.126
    620200-2.144
    720300-2.151
    820400-2.143
    920100.5-1.092
    1020101.0-0.049
    1120101.50.843
    1220102.01.606
    Table 2. The effect of channel length L and compensation value a for the indentation of photoresist
    NO.W/μmL/μma/μmT/nmt/nm
    120302 042.521 448.52
    220402 038.161 074.12
    320502 043.59821.65
    420602 039.97696.58
    5201002 045.24492.42
    6202002 040.76466.35
    7203002 047.78446.47
    8204002 043.63434.28
    Table 3. The thickness of photoresist in TFT channel
    NO.W/μmL/μma/μmL1/μmc/μm
    1203003.000
    220400.6773.323
    320501.2372.763
    420603.7742.226
    5201008.1281.872
    62020018.1761.824
    72030028.1691.831
    82040038.1881.812
    Table 4. The effect of channel length L for the trail of photoresist
    AVG5.1510.82
    U/(%)5.342.73
    Table 5. The channel length and width values after etching and stripping