• Opto-Electronic Engineering
  • Vol. 51, Issue 11, 240163-1 (2024)
Jingyuan Liang1, Xiwen Li1, Chenghu Ke2, and Xizheng Ke1,3,*
Author Affiliations
  • 1School of Automation and Information Engineering, Xi'an University of Technology, Xi’an, Shaanxi 710048, China
  • 2School of Information Engineering, Xi’an University, Xi’an, Shaanxi 710048, China
  • 3Shaanxi Civil-Military Integration Key Laboratory of Intelligence Collaborative Networks, Xi’an, Shaanxi 710048, China
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    DOI: 10.12086/oee.2024.240163 Cite this Article
    Jingyuan Liang, Xiwen Li, Chenghu Ke, Xizheng Ke. Surface characterization using Zernike polynomials[J]. Opto-Electronic Engineering, 2024, 51(11): 240163-1 Copy Citation Text show less

    Abstract

    Zernike polynomials, due to their orthogonality and rotational invariance, are widely used in the characterization and optimization of optical surfaces. They can effectively reduce fitting errors and provide high-precision descriptions of complex surfaces with only a few coefficients, contributing to improved imaging quality and simplified performance analysis in optical systems. This paper provides an overview of freeform surface description methods, including both global and local approaches. It discusses the research progress on Zernike polynomials in surface characterization, both domestically and internationally, explores their practical applications in this field, and finally anticipates the future prospects of Zernike polynomials in surface characterization.
    Jingyuan Liang, Xiwen Li, Chenghu Ke, Xizheng Ke. Surface characterization using Zernike polynomials[J]. Opto-Electronic Engineering, 2024, 51(11): 240163-1
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