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    Journals >Infrared and Laser Engineering >Volume 35 >Issue 1 >Page 82 > Article
    • Infrared and Laser Engineering
    • Vol. 35, Issue 1, 82 (2006)
    Measurement and analysis of surface profiles by optical scattering method
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese]. Measurement and analysis of surface profiles by optical scattering method[J]. Infrared and Laser Engineering, 2006, 35(1): 82 Copy Citation Text show less

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    [in Chinese]. Measurement and analysis of surface profiles by optical scattering method[J]. Infrared and Laser Engineering, 2006, 35(1): 82
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