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    Journals >Opto-Electronic Engineering >Volume 31 >Issue z1 >Page 124 > Article
    • Opto-Electronic Engineering
    • Vol. 31, Issue z1, 124 (2004)
    Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/IITO
    1, 2, 1, 1, and 1
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/IITO[J]. Opto-Electronic Engineering, 2004, 31(z1): 124 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Surface analysis using AFM and XPS for LiBq4/ITO and LiBq4/CuPc/IITO[J]. Opto-Electronic Engineering, 2004, 31(z1): 124
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