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Instrumentation, Measurement and Metrology
X‑Ray Mirror Surface Profile Measurement with Nanometer Accuracy Based on Three‑Displacement Sensors
Jiezhuo Wang, Guang Zhou, Weizheng Lei, Xiaohao Dong, and Jie Wang
Acta Optica Sinica
- Mar. 26, 2025
- Vol. 45, Issue 5 (2025)
Spectroscopy
Yuanqing Wan, Weijun Liu, Haoxiang Yu, and Shuming Wang
Acta Optica Sinica
- Mar. 26, 2025
- Vol. 45, Issue 5 (2025)
Remote Sensing and Sensors
Xinglei Zhao, Meili Zhu, Kewen Hu, and Fengnian Zhou
Acta Optica Sinica
- Mar. 26, 2025
- Vol. 45, Issue 12 (2025)
Fiber Optics and Optical Communications
Xuegui Zhu, Qingchao Wu, Huaiqing Zhang, Wenchao Yu, and Gengjian Liu
Acta Optica Sinica
- Mar. 26, 2025
- Vol. 45, Issue 5 (2025)
Atmospheric Optics and Oceanic Optics
Zhiqi Liang, Lianbo Hu, and Shuguo Chen
Acta Optica Sinica
- Mar. 26, 2025
- Vol. 45, Issue 6 (2025)
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- Acta Optica Sinica
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