• Journal of Inorganic Materials
  • Vol. 39, Issue 8, 903 (2024)
Xin MIAO1, Shiqiang YAN1, Jindou WEI1, Chao WU1..., Wenhao FAN2 and Shaoping CHEN1,*|Show fewer author(s)
Author Affiliations
  • 11. College of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, China
  • 22. College of Physics, Taiyuan University of Technology, Taiyuan 030024, China
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    DOI: 10.15541/jim20240057 Cite this Article
    Xin MIAO, Shiqiang YAN, Jindou WEI, Chao WU, Wenhao FAN, Shaoping CHEN. Interface Layer of Te-based Thermoelectric Device: Abnormal Growth and Interface Stability[J]. Journal of Inorganic Materials, 2024, 39(8): 903 Copy Citation Text show less
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    Xin MIAO, Shiqiang YAN, Jindou WEI, Chao WU, Wenhao FAN, Shaoping CHEN. Interface Layer of Te-based Thermoelectric Device: Abnormal Growth and Interface Stability[J]. Journal of Inorganic Materials, 2024, 39(8): 903
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