Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor

Minjie Yang; Yunsheng Qian; Yiyun Yan; Sheng Wu

doi:10.3788/LOP212537

Journals >Laser & Optoelectronics Progress >Volume 60 >Issue 2 >Page 0222001 > Article

Laser & Optoelectronics Progress
Vol. 60, Issue 2, 0222001 (2023)

Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor

Minjie Yang, Yunsheng Qian^*, Yiyun Yan, and Sheng Wu

Author Affiliations

School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu , China

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DOI: 10.3788/LOP212537 Cite this Article Set citation alerts

Minjie Yang, Yunsheng Qian, Yiyun Yan, Sheng Wu. Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0222001 Copy Citation Text

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Article index updated: Apr. 2, 2025

The article is cited by 6 article(s) CLP online library. (Some content might be in Chinese.)

Minjie Yang, Yunsheng Qian, Yiyun Yan, Sheng Wu. Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0222001

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