• Laser & Optoelectronics Progress
  • Vol. 60, Issue 2, 0222001 (2023)
Minjie Yang, Yunsheng Qian*, Yiyun Yan, and Sheng Wu
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu , China
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    DOI: 10.3788/LOP212537 Cite this Article Set citation alerts
    Minjie Yang, Yunsheng Qian, Yiyun Yan, Sheng Wu. Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0222001 Copy Citation Text show less
    References

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    [2] Yao Z, Cheng H C, Li T et al. Research on afterglow measurement method of image intensifier based on P31 phosphor powder[J]. Journal of Applied Optics, 41, 796-800(2020).

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    [10] Li X F, Li J J, Li J S et al. Measure and comparison between the second-generation and the third-generation image intensifier within the different region of wavelength[J]. Acta Photonica Sinica, 50, 0225001(2021).

    [11] Cui D X, Zheng S C, Qiu Y F et al. Output signal-to-noise ratio characteristics of microchannel plate[J]. Chinese Journal of Vacuum Science and Technology, 32, 468-471(2012).

    [12] Bai X F, Su J H, Shi F et al. Illumination-adjusting technology of light source used for image intensifier comprehensive testing[J]. Journal of Applied Optics, 30, 806-809(2009).

    Minjie Yang, Yunsheng Qian, Yiyun Yan, Sheng Wu. Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0222001
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