Minjie Yang, Yunsheng Qian, Yiyun Yan, Sheng Wu. Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0222001
- Laser & Optoelectronics Progress
- Vol. 60, Issue 2, 0222001 (2023)
Fig. 1. Block diagram of scintillation noise comprehensive test system
Fig. 2. Overall logical framework diagram
Fig. 3. Software interface of upper computer
Fig. 4. Binarization and connected domain detection results
Fig. 5. Thermal diagrams of discrete coefficient under different illuminance . (a) Illuminance is 5×10-7 lx; (b) illuminance is 7×10-6 lx;(c) illuminance is 1.2×10-6 lx; (d) illuminance is 2.8×10-6 lx; (e) illuminance is 6.37×10-6 lx; (f) illuminance is 1.34×10-5 lx
Fig. 6. Discrete coefficient thermal maps of different image intensifiers
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Table 1. Parameters of image intensifier to be measured
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Table 2. The average amount of highlight noise obtained by image intensifier when the threshold value of binarization is 100
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