S. Z. Yi, J. Q. Dong, L. Jiang, Q. S. Huang, E. F. Guo, Wang Z. S.. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902
- Matter and Radiation at Extremes
- Vol. 7, Issue 1, 015902 (2022)
Fig. 1. Schematic of simultaneous high-resolution x-ray backlighting and self-emission imaging by a two-channel multilayer KB microscope.
Fig. 2. Optical arrangement of the two-energy KB microscope in the meridional and sagittal directions.
Fig. 3. Spatial resolution of the KB microscope simulated by Zemax software.
Fig. 4. Spectral response of the KB microscope for x-ray backlighting and self-emission imaging.
Fig. 5. Results of evaluation of spatial resolution for a 600-mesh Au grid backlit by a copper x-ray tube.
Fig. 6. Simultaneous backlighting and self-emission x-ray imaging of a direct drive CH shell target, taken by the KB microscope and streak camera at the SG-III prototype laser facility.
Fig. 7. Outer-boundary trajectory (red line) of the capsule shell extracted from the upper half of the backlit image in Fig. 6 and the hotspot-emission history (blue line) extracted from the center of the self-emission image in Fig. 6 .
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Table 1. Optical parameters of the KB microscope.
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