• Matter and Radiation at Extremes
  • Vol. 7, Issue 1, 015902 (2022)
S. Z. Yi1,2, J. Q. Dong3, L. Jiang1,2, Q. S. Huang1,2..., E. F. Guo3 and Wang Z. S.1,2,a)|Show fewer author(s)
Author Affiliations
  • 1MOE Key Laboratory of Advanced Micro-Structured Materials, No. 1239 Siping Road, Shanghai 200092, China
  • 2School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
  • 3Shanghai Institute of Laser Plasma, CAEP, P.O. Box 919-988, Shanghai 201800, China
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    DOI: 10.1063/5.0062758 Cite this Article
    S. Z. Yi, J. Q. Dong, L. Jiang, Q. S. Huang, E. F. Guo, Wang Z. S.. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902 Copy Citation Text show less
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    [8] Y. Q.Gu, Q. S.Huang, Z. S.Wang, L.Wei, S. Z.Yi, F.Zhang. High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility. High Power Laser Sci. Eng., 9, e42(2021).

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    S. Z. Yi, J. Q. Dong, L. Jiang, Q. S. Huang, E. F. Guo, Wang Z. S.. Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope[J]. Matter and Radiation at Extremes, 2022, 7(1): 015902
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