Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 60 >Issue 2 >Page 0210012 > Article
    • Laser & Optoelectronics Progress
    • Vol. 60, Issue 2, 0210012 (2023)
    Point Cloud Completion Network Based on Multiencoders and Residual-Transformer
    Hui Gao, Zhijing Yang*, Wing-Kuen Ling, Jiangzhong Cao, and Weijie Li
    Author Affiliations
  • School of Information Engineering, Guangdong University of Technology, Guangzhou 510006, Guangdong, China
    • show less
    DOI: 10.3788/LOP213314 Cite this Article Set citation alerts
    Hui Gao, Zhijing Yang, Wing-Kuen Ling, Jiangzhong Cao, Weijie Li. Point Cloud Completion Network Based on Multiencoders and Residual-Transformer[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0210012 Copy Citation Text show less
    Cited By
    Article index updated: Apr. 5, 2025
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (8)
    Equations (11)
    References (26)
    Cited By (1)
    Get Citation
    Copy Citation Text
    Hui Gao, Zhijing Yang, Wing-Kuen Ling, Jiangzhong Cao, Weijie Li. Point Cloud Completion Network Based on Multiencoders and Residual-Transformer[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0210012
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology