Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219

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- Opto-Electronic Engineering
- Vol. 46, Issue 2, 180219 (2019)
Abstract

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