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    Journals >Opto-Electronic Engineering >Volume 46 >Issue 2 >Page 180219 > Article
    • Opto-Electronic Engineering
    • Vol. 46, Issue 2, 180219 (2019)
    Design and error analysis of multi-spectral and multi-axis parallelism testing scheme
    Huang Fuyu1,*, Li Gang1, Shi Yunsheng2, Zhang Xiaoliang1..., Zou Changfan3 and Yu Ye3|Show fewer author(s)
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.12086/oee.2019.180219 Cite this Article
    Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219 Copy Citation Text show less
    References

    [5] Xiao Z J, Guo X X, Xia Y, et al. Research on detection system of optical sights triaxial parallelism[J]. Optik -International Journal for Light and Electron Optics, 2014, 125(16): 4427–4430.

    CLP Journals

    [1] JIA Wen-wu, LIU Pei-zheng, TANG Zi-li, ZHANG San-xi, HU Qiu-ping. Detection method for optical-axis parallelism of photoelectric theodolite in range[J]. Optics and Precision Engineering, 2020, 28(8): 1670

    [2] JIA Wen-wu, LIU Pei-zheng, TANG Zi-li, ZHANG San-xi, HU Qiu-ping. Detection method for optical-axis parallelism of photoelectric theodolite in range[J]. Optics and Precision Engineering, 2020, 28(8): 1670

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    Huang Fuyu, Li Gang, Shi Yunsheng, Zhang Xiaoliang, Zou Changfan, Yu Ye. Design and error analysis of multi-spectral and multi-axis parallelism testing scheme[J]. Opto-Electronic Engineering, 2019, 46(2): 180219
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