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    Journals >Acta Optica Sinica >Volume 43 >Issue 19 >Page 1928001 > Article
    • Acta Optica Sinica
    • Vol. 43, Issue 19, 1928001 (2023)
    Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions
    Xu Nie1, Zujun Wang1,2,*, Baichuan Wang2, Yuanyuan Xue2..., Gang Huang1, Shankun Lai1, Ning Tang1, Maocheng Wang2, Mingtong Zhao2, Fuyu Yang2 and Zhongming Wang2|Show fewer author(s)
    Author Affiliations
  • 1School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, Hunan , China
  • 2State Key Laboratory of Intense Pulsed Irradiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an 710024, Shaanxi , China
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    DOI: 10.3788/AOS230592 Cite this Article Set citation alerts
    Xu Nie, Zujun Wang, Baichuan Wang, Yuanyuan Xue, Gang Huang, Shankun Lai, Ning Tang, Maocheng Wang, Mingtong Zhao, Fuyu Yang, Zhongming Wang. Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions[J]. Acta Optica Sinica, 2023, 43(19): 1928001 Copy Citation Text show less
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    Article index updated: Apr. 26, 2025
    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
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    Xu Nie, Zujun Wang, Baichuan Wang, Yuanyuan Xue, Gang Huang, Shankun Lai, Ning Tang, Maocheng Wang, Mingtong Zhao, Fuyu Yang, Zhongming Wang. Experiment and Analysis of Damage of CMOS Image Sensor Induced by Proton Irradiation with Different Bias Conditions[J]. Acta Optica Sinica, 2023, 43(19): 1928001
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    Paper Information
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