• Laser & Optoelectronics Progress
  • Vol. 60, Issue 15, 1525001 (2023)
Aoxiang Zhang1, Bingyang Ren2, Fang Wang1,3,4,5,*, Juin. J. Liou1,3,5, and Yuhuai Liu1,3,4,5,**
Author Affiliations
  • 1National Center for International Joint Research of Electronic Materials and Systems, International Joint-Laboratory of Electronic Materials and Systems of Henan Province, School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou 450001, Henan, China
  • 2School of Computer and Artificial Intelligence, Zhengzhou University, Zhengzhou 450001, Henan, China
  • 3Institute of Intelligent Sensing, Zhengzhou University, Zhengzhou 450001, Henan, China
  • 4Zhengzhou Way Do Electronics Co., Ltd., Zhengzhou 450001, Henan, China
  • 5Research Institute of Industrial Technology Co., Ltd., Zhengzhou University, Zhengzhou, Henan 450001, China
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    DOI: 10.3788/LOP221886 Cite this Article Set citation alerts
    Aoxiang Zhang, Bingyang Ren, Fang Wang, Juin. J. Liou, Yuhuai Liu. Performance Enhancement of Algan-Based Deep Ultraviolet Laser Diodes with Step Superlattice Electron Blocking Layer and Wedge-Shaped Hole Blocking Layer[J]. Laser & Optoelectronics Progress, 2023, 60(15): 1525001 Copy Citation Text show less
    Schematic diagram of basic structure of DUV LDs
    Fig. 1. Schematic diagram of basic structure of DUV LDs
    Schematic diagram of aluminum component change. (a) RSL EBL; (b)TS HBL; (c) SSL EBL; (d) WS HBL
    Fig. 2. Schematic diagram of aluminum component change. (a) RSL EBL; (b)TS HBL; (c) SSL EBL; (d) WS HBL
    Band diagram and quasi-Fermi level diagram. (a) Structure A; (b) structure B; (c) structure C
    Fig. 3. Band diagram and quasi-Fermi level diagram. (a) Structure A; (b) structure B; (c) structure C
    Distribution of carrier concentration. (a) Electron concentration in the QWs; (b) hole concentration in the QWs; (c) electron leakage in the p-type region; (d) hole leakage in the n-type region
    Fig. 4. Distribution of carrier concentration. (a) Electron concentration in the QWs; (b) hole concentration in the QWs; (c) electron leakage in the p-type region; (d) hole leakage in the n-type region
    Experimental results. (a) Radiation recombination rate; (b) P-I curves
    Fig. 5. Experimental results. (a) Radiation recombination rate; (b) P-I curves
    Experimental results. (a) I-V curves of three structures; (b) electro-optical conversion efficiency of three structures
    Fig. 6. Experimental results. (a) I-V curves of three structures; (b) electro-optical conversion efficiency of three structures
    Aoxiang Zhang, Bingyang Ren, Fang Wang, Juin. J. Liou, Yuhuai Liu. Performance Enhancement of Algan-Based Deep Ultraviolet Laser Diodes with Step Superlattice Electron Blocking Layer and Wedge-Shaped Hole Blocking Layer[J]. Laser & Optoelectronics Progress, 2023, 60(15): 1525001
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