Electromagnetic modeling of interference, confocal, and focus variation microscopy

Tobias Pahl; Felix Rosenthal; Johannes Breidenbach; Corvin Danzglock; Sebastian Hagemeier; Xin Xu; Marco Künne; Peter Lehmann

doi:10.1117/1.APN.3.1.016013

Journals >Advanced Photonics Nexus >Volume 3 >Issue 1 >Page 016013 > Article

Advanced Photonics Nexus
Vol. 3, Issue 1, 016013 (2024)

Electromagnetic modeling of interference, confocal, and focus variation microscopy

Tobias Pahl^*, Felix Rosenthal, Johannes Breidenbach, Corvin Danzglock..., Sebastian Hagemeier, Xin Xu, Marco Künne and Peter Lehmann|Show fewer author(s)

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University of Kassel, Faculty of Electrical Engineering and Computer Science, Measurement Technology Group, Kassel, Germany

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DOI: 10.1117/1.APN.3.1.016013 Cite this Article Set citation alerts

Tobias Pahl, Felix Rosenthal, Johannes Breidenbach, Corvin Danzglock, Sebastian Hagemeier, Xin Xu, Marco Künne, Peter Lehmann, "Electromagnetic modeling of interference, confocal, and focus variation microscopy," Adv. Photon. Nexus 3, 016013 (2024) Copy Citation Text

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