Characterization of single-pulse photon energy and photon energy jitter at the Shanghai soft X-ray Free-Electron Laser

Zichen Gao; Yajun Tong; Yueran Wang; Xinyuan Wang; Pingping Wen; Donghao Lu; Xinye Yuan; Difei Zhang; Jingcheng Xiao; Xiaokai Li; Zhihao Guan; Jiacheng Gu; Yonggan Nie; Zhi Guo; Zhen Wang; Chao Feng; Jiadong Fan; Huaidong Jiang

doi:10.3788/COL202422.103401

Journals >Chinese Optics Letters >Volume 22 >Issue 10 >Page 103401 > Article

Chinese Optics Letters
Vol. 22, Issue 10, 103401 (2024)

Characterization of single-pulse photon energy and photon energy jitter at the Shanghai soft X-ray Free-Electron Laser

Zichen Gao¹, Yajun Tong², Yueran Wang¹, Xinyuan Wang¹..., Pingping Wen¹, Donghao Lu¹, Xinye Yuan¹, Difei Zhang¹, Jingcheng Xiao¹, Xiaokai Li², Zhihao Guan², Jiacheng Gu², Yonggan Nie², Zhi Guo³, Zhen Wang³, Chao Feng³, Jiadong Fan^2,* and Huaidong Jiang^1,2,**|Show fewer author(s)

Author Affiliations

¹School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China

²Center for Transformative Science, ShanghaiTech University, Shanghai 201210, China

³Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, China

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DOI: 10.3788/COL202422.103401 Cite this Article Set citation alerts

Zichen Gao, Yajun Tong, Yueran Wang, Xinyuan Wang, Pingping Wen, Donghao Lu, Xinye Yuan, Difei Zhang, Jingcheng Xiao, Xiaokai Li, Zhihao Guan, Jiacheng Gu, Yonggan Nie, Zhi Guo, Zhen Wang, Chao Feng, Jiadong Fan, Huaidong Jiang, "Characterization of single-pulse photon energy and photon energy jitter at the Shanghai soft X-ray Free-Electron Laser," Chin. Opt. Lett. 22, 103401 (2024) Copy Citation Text

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Abstract

The X-ray free-electron laser (XFEL), a new X-ray light source, presents numerous opportunities for scientific research. Self-amplified spontaneous emission (SASE) is one generation mode of XFEL in which each pulse is unique. In this paper, we propose a pinhole diffraction method to accurately determine the XFEL photon energy, pulses’ photon energy jitter, and sample-to-detector distance for soft X-ray. This method was verified at Shanghai soft X-ray Free-Electron Laser (SXFEL). The measured average photon energy was 406.5 eV, with a photon energy jitter (root-mean-square) of 1.39 eV, and the sample-to-detector distance was calculated to be 16.61 cm.

Keywords

photon energy characterization photon energy jitter self-amplified spontaneous emission XFEL single-pulse diffraction X-ray free-electron laser